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ESD Simulator Clamping Measurement
Transient Behavior Modeling
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ESD Simulator Clamping Measurement
Transient Behavior Modeling
Long Pulse EOS (200ns – 1mS) Failure Testing
Low Voltage Surge (8/20 & 10/1000 us) Pulsed Failure Testing
CDM (Charged Device Model) Testing
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Probing Solutions
Services
General Test and Analysis
Transmission Line Pulse (TLP) Testing
TVS Performance Characterization
TLP / vf-TLP Measurement
S21 / S21dd Measurement
VNA Capacitance Measurement
LCR Capacitance Measurement
Harmonic Generation Measurement
ESD Simulator Clamping Measurement
Transient Behavior Modeling
Long Pulse EOS (200ns – 1mS) Failure Testing
Low Voltage Surge (8/20 & 10/1000 us) Pulsed Failure Testing
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EPM-VF2 External vf-TLP Pulse Module
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ES650 Automated Probing System
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CC-TLP-1 Capacitively Coupled TLP Probe
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ES660 ESD and Latch-UP Test System
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LISN-C01 Custom Unbalanced Very High Frequency Line Impedance Stabilization Network (15A, 30-200MHz, unbalanced 2/3 wire VHF LISN)
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TVS-15G Transient Voltage Suppressor, DC – 15 GHz
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