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Device Level ESD Solutions
System Level ESD Solutions
EMC Solutions
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TEM Cell Solutions
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Current Probe Solutions
HV Supply Solutions
HV Measurement Solutions
Probing Solutions
Services
General Test and Analysis
Transmission Line Pulse (TLP) Testing
TVS Performance Characterization
TLP / vf-TLP Measurement
S21 / S21dd Measurement
VNA Capacitance Measurement
LCR Capacitance Measurement
Harmonic Generation Measurement
ESD Simulator Clamping Measurement
Transient Behavior Modeling
Long Pulse EOS (200ns – 1mS) Failure Testing
Low Voltage Surge (8/20 & 10/1000 us) Pulsed Failure Testing
CDM (Charged Device Model) Testing
HBM (Human Body Model) & MM (Machine Model) Testing
LI-CCDM (Low Impedance -Contact first CDM)
CC-TLP Testing
CDE (Cabe Discharge Event) Testing
Calibration Services
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Device Level ESD Solutions
System Level ESD Solutions
EMC Solutions
LISN Solutions
TEM Cell Solutions
RF Solutions
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HV Measurement Solutions
Probing Solutions
Services
General Test and Analysis
Transmission Line Pulse (TLP) Testing
TVS Performance Characterization
TLP / vf-TLP Measurement
S21 / S21dd Measurement
VNA Capacitance Measurement
LCR Capacitance Measurement
Harmonic Generation Measurement
ESD Simulator Clamping Measurement
Transient Behavior Modeling
Long Pulse EOS (200ns – 1mS) Failure Testing
Low Voltage Surge (8/20 & 10/1000 us) Pulsed Failure Testing
CDM (Charged Device Model) Testing
HBM (Human Body Model) & MM (Machine Model) Testing
LI-CCDM (Low Impedance -Contact first CDM)
CC-TLP Testing
CDE (Cabe Discharge Event) Testing
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Device Level ESD Solutions
System Level ESD Solutions
EMC Solutions
LISN Solutions
TEM Cell Solutions
RF Solutions
Current Probe Solutions
HV Supply Solutions
HV Measurement Solutions
Probing Solutions
Services
General Test and Analysis
Transmission Line Pulse (TLP) Testing
TVS Performance Characterization
TLP / vf-TLP Measurement
S21 / S21dd Measurement
VNA Capacitance Measurement
LCR Capacitance Measurement
Harmonic Generation Measurement
ESD Simulator Clamping Measurement
Transient Behavior Modeling
Long Pulse EOS (200ns – 1mS) Failure Testing
Low Voltage Surge (8/20 & 10/1000 us) Pulsed Failure Testing
CDM (Charged Device Model) Testing
HBM (Human Body Model) & MM (Machine Model) Testing
LI-CCDM (Low Impedance -Contact first CDM)
CC-TLP Testing
CDE (Cabe Discharge Event) Testing
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Transmission Line Pulse
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ES622 Series TLP Pulsed IV-Curve System
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