This report documents the CC-TLP (Charged Device Model – Transmission Line Pulse) testing performed on Die B at the die level. The purpose of this test is to evaluate the ESD (Electrostatic Discharge) robustness of the device under test (DUT) by applying CC-TLP pulses at various current levels and monitoring the leakage current before and after each pulse.
by Keith Miller, Joey Fang, Jared Floyd, Yingjie Gan