Description
1. Description
The CC-TLP module utilizes the principle of Transmission Line Pulsing (TLP) where a transmission line is capacitively coupled to the device under test. When a pulse is applied to the transmission line, charge is transferred through the capacitor to simulate an Electrostatic Discharge (ESD) event on the device. CC-TLP involves applying extremely short yet high-voltage pulses on the transmission line to simulate ESD events and the amplitude/duration of CC-TLP are adjusted according to testing requirements.
2. Features
- 18 GHz SMA connector
- Tilt depth & angle adjustment
- Compatible with probing station
- Reproducible CDM-like stress
- Calibration gauge for needle height adjustment
- Easily replaceable coaxial tip
3. Applications
- CDM Events Test for Wafer Level
- Device and Materials CDM Failure Analysis
- Meet ANSI/ESD SP5.3.4 Standard
4. Specifications
| Parameters | CC-TLP-1-50 | CC-TLP-1-90 | Unit | Comments |
| SMA Connection Bandwidth | 18 | GHz | ||
| Needle Tip Radius | 0.5, 1, 5 | µm | Default 5 um | |
| Needle Slot | 1 | mm | ||
| GND Diameter | 50 | 90 | mm | |
5. Ordering Information
| Line | Part # | Description | Status |
| 1 | CCTLP-1-90 | CC-TLP Probe with 90 mm diameter GND Plate | Active |
| 2 | CCTLP-1-50 | CC-TLP Probe with 50 mm diameter GND Plate | Active |
| 3 | CCTLP-CAL-1 | CC-TLP needle height calibration gauge | Active |
| 4 | CC-TLP-1-RN5 | CC-TLP Replacement Probe – 5 um radius tungsten tip | Active |
| 5 | CC-TLP-1-RN1 | CC-TLP Replacement Probe – 1 um radius tungsten tip | Active |
| 6 | CC-TLP-1-RN0p5 | CC-TLP Replacement Probe – 0.5 um radius tungsten tip | Active |

