July 26, 2024 by ESDEMC
- Widely Supported Test Methods & Standards
- Flexible Bias and Pin Count Configurations
- High Power Through Put Per Card
- Multi-Protocol Preconditioning Setup
- Integrated Themo Forcing and Monitoring
Widely Supported Test Methods & Standards
HBM, MM, LU, TLU (with TLP, EOS, LVS as TLU Sources)
Flexible Bias and Pin Count Configurations
64 Pins incremental Configuration, 3/5/7/9+1 DC Configuration
High Power Through Put Per Card
E.g. 30/15A per Ch, 3-9 Ch per Card, 16 Cards for 1024 pin system
Multi-Protocol Preconditioning Setup
Integrated Themo Forcing and Monitoring
High speed and high memory depth data stream with open API
Advanced IC Power Monitoring and Themo Control
ESDEMC Technology LLC is excited to announce the launch of the ES620-C2 Inline TLP Test System, our latest innovation designed specifically to bring laboratory-grade Transmission
ESDEMC Technology LLC is excited to unveil the release of the stand-alone 20 ps Rise Time Pulse Module. The module delivers high-speed transmission line rectangular
March 1, 2025 – ESDEMC today announced the establishment of its European Service Center in Graz, Austria. This milestone reflects the company’s commitment to expanding
January 18, 2025 – ESDEMC has introduced an update to the JS002 testing option for its ES640 system, adding a wafer-level version with a newly
Recently, ESDEMC Technology LLC and the School of Engineering at South China Normal University signed a strategic cooperation agreement to establish a joint laboratory. The
ESDEMC has announced the launch of the upgraded ES806 Explosive ESD Testing System. The new system features a refreshed design and significant improvements in usability,
